Probe Station Manipulator

Probe Station Manipulator

The PSIO-41 Micromanipulator Probe station is a precision mechanical device used in a probe station to position and control electrical probes on the surface of a semiconductor wafer or microelectronic device. It allows researchers and engineers to make accurate contact with specific points on a test sample to measure electrical characteristics such as voltage, current, or resistance.

 

Key Features of a Probe Station:

1). Precision Micropositioners:

Allows fine XYZ movement for accurate probe placement on microscopic features.

2). High Magnification Optics:

Integrated microscopes (optical or digital) for clear visualization of test points on wafers, chips, or materials.

3). Stable and Vibration-Free Platform:

Rigid structure to minimize vibrations and ensure stable measurements.

4). Thermal Chuck (Optional):

Allows temperature-controlled testing (hot/cold) of devices during probing.

5). Vacuum Chuck/Wafer Holder:

Securely holds wafers, dies, or substrates during testing.

6). Multiple Probe Arms:

Typically supports 2 to 8 or more probe arms for simultaneous multi-point contact.

7). Manual, Semi-Automatic, or Fully Automated Operation:

Ranges from basic manual control to fully computer-controlled probe stations for high-throughput testing.

8). Electrical Shielding / Faraday Cage (Optional):

Reduces electromagnetic interference for sensitive measurements.

9). Versatile Sample Sizes:

Compatible with small dies to full-size wafers (e.g., 4", 6", 8", or 12").

10). Integration with Test Equipment:

Connects easily with oscilloscopes, source meters, LCR meters, and analyzers.

11). Probe Types Support:

Supports RF, DC, high-voltage, high-current, or cryogenic probes depending on application.

12). ESD Protection:

Ensures safe handling of electrostatic-sensitive devices.

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